Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles - Concepedia

Concepedia

Publication | Closed Access

Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles

128

Citations

5

References

1998

Year

Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, W. M. Paulson, R. L. Hance

Thin Solid Films

EngineeringPhysicsOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsInfrared SpectroscopyAnalytical ChemistryInstrumentationOptical SpectroscopySpectroscopic PropertySpectroscopic Method

References

	Year	Citations

Page 1