P.S. Hauge - Concepedia

Concepedia

Author

P.S. Hauge

IBM Research - Thomas J. Watson Research Center

Also Known As

P. S. Hauge, P.S. Hauge, Peter S. Hauge

32

Publications

1.8K

Citations

15

H-Index

94

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center University of Minnesota

PH

About

P.S. Hauge is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, instrumentation, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	17	1.6K
2	Education	6	6	572
3	Natural Sciences	5	5	419
4	Health Sciences	1	1	416
5	Social Sciences	1	1	12

P.S. Hauge

×

20

Publications

1.8K

Citations

15

H-Index

	Year	Citations
Characterization of positive photoresist F.H. Dill, W.P. Hornberger, P.S. Hauge, IEEE Transactions on Electron Devices Positive Photoresist ExposureImage FormationFunctional ParametersEngineeringOphthalmology	1975	416
Recent developments in instrumentation in ellipsometry P.S. Hauge Surface Science EngineeringMeasurementCalibrationEducationInstrumentation	1980	237
Generation of performance constraints for layout R. Nair, C.L. Berman, P.S. Hauge, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringComputer ArchitectureNetwork AnalysisComputer-aided DesignInterconnection Network Architecture	1989	195
Mueller matrix ellipsometry with imperfect compensators P.S. Hauge Journal of the Optical Society of America Mueller MatrixOptical MaterialsEngineeringGeometryOptical Testing	1978	173
Design and Operation of ETA, an Automated Ellipsometer P.S. Hauge, F.H. Dill IBM Journal of Research and Development Optical MaterialsEngineeringGeometryOptical TestingComputer-aided Design	1973	147
Circuit Placement for Predictable Performance P.S. Hauge International Conference on Computer Aided Design Physical Design (Electronics)EngineeringCircuit SystemCircuit DesignComputer Engineering	1987	122
A rotating-compensator fourier ellipsometer P.S. Hauge, F.H. Dill Optics Communications Monge-ampere EquationPhysicsFourier AnalysisGeometric Singular Perturbation TheoryRotating-compensator Fourier Ellipsometer	1975	103
Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry P.S. Hauge, Rolf Müller, C. Smith Surface Science Mueller-stokes Calculus	1980	66
Microwave measurement of the velocity-field characteristic of GaAs N. Braslau, P.S. Hauge IEEE Transactions on Electron Devices EngineeringMeasurementEducationBar SamplesSemiconductor Device	1970	57
Generalized rotating-compensator ellipsometry P.S. Hauge Surface Science Orbit DeterminationEngineeringRotating-compensator EllipsometryGeometryMechanical Systems	1976	56

Page 1