R. A. Synowicki

Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

R. A. Synowicki · Thin Solid Films · 1998 · 280 citations

Materials Science, Surface Characterization, Optical Materials +10

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

John A. Woollam, Blaine Johs, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 215 citations

Optical Materials, Engineering, Typical Applications +18

Suppression of backside reflections from transparent substrates

R. A. Synowicki · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2008 · 102 citations

Materials Science, Float Glass, Optical Materials +13

Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

Blaine Johs, John A. Woollam, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 101 citations

Optical Materials, Engineering, Optical Testing +16

Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy

Preston T. Webster, Nathaniel A. Riordan, S. Liu et al. · Journal of Applied Physics · 2015 · 95 citations

Engineering, Absorption Spectroscopy, Spectroscopic Property +25