Concepedia

Tom Tiwald

TT

Statistics

Publications

39

Citations

2.1K

H-Index

21

Active since

1988

Affiliations

J.A. Woollam Company (United States)(Current)

University of Nebraska–Lincoln

Motorola (United States)

Leipzig University

Procter & Gamble (United States)

Tom Tiwald is an author at J.A. Woollam Company (United States) specializing in materials science, natural sciences, and ellipsometry.

ORCID

Publications per year

1988–2024

39

Publications

39

Infrared dielectric anisotropy and phonon modes of sapphire

M. Schubert, Tom Tiwald, Craig M. Herzinger · Physical review. B, Condensed matter · 2000 · 375 citations

, , +17

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald et al. · Thin Solid Films · 2008 · 308 citations

, , +12

Free-carrier and phonon properties of<i>n</i>- and<i>p</i>-type hexagonal GaN films measured by infrared ellipsometry

A. Kasic, M. Schubert, S. Einfeldt et al. · Physical review. B, Condensed matter · 2000 · 257 citations

, , +17

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

Stefan Zollner, Alexander A. Demkov, R. Liu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 120 citations · Full text

, , +17

Variable-wavelength frequency-domain terahertz ellipsometry

Tino Hofmann, Craig M. Herzinger, A. Boosalis et al. · Review of Scientific Instruments · 2010 · 95 citations

, , +15

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