Tom Tiwald

Infrared dielectric anisotropy and phonon modes of sapphire

M. Schubert, Tom Tiwald, Craig M. Herzinger · Physical review. B, Condensed matter · 2000 · 365 citations

Optical Materials, Engineering, Anisotropic Dielectric Response +20

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald et al. · Thin Solid Films · 2008 · 305 citations

Materials Science, Optical Materials, Engineering +10

Free-carrier and phonon properties of<i>n</i>- and<i>p</i>-type hexagonal GaN films measured by infrared ellipsometry

A. Kasic, M. Schubert, S. Einfeldt et al. · Physical review. B, Condensed matter · 2000 · 256 citations

-Gan Films, Infrared Spectroscopic Ellipsometry, Wide-bandgap Semiconductor +20

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

Stefan Zollner, Alexander A. Demkov, R. Liu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 118 citations · Full text

Optical Materials, Engineering, Thin-film Srtio3 +17

Variable-wavelength frequency-domain terahertz ellipsometry

Tino Hofmann, Craig M. Herzinger, A. Boosalis et al. · Review of Scientific Instruments · 2010 · 91 citations