Publication | Closed Access
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
305
Citations
14
References
2008
Year
Materials ScienceOptical MaterialsEngineeringOptical PropertiesSpectroscopySurface ScienceApplied PhysicsSpectroscopic EllipsometryLight AbsorptionThin Film Process TechnologyThin FilmsSpectroscopic PropertyThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1