Diana Convey

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald et al. · Thin Solid Films · 2008 · 308 citations

Natural Sciences, Materials Science, Physics +12

Pore- and micro-structural characterization of a novel structural binder based on iron carbonation

Sumanta Das, David Stone, Diana Convey et al. · Materials Characterization · 2014 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +14

Spectroscopic ellipsometry measurements of thin metal films

Harland G. Tompkins, Sonja Tasic, Jeff Baker et al. · Surface and Interface Analysis · 2000 · 44 citations

Natural Sciences, Materials Engineering, Materials Science +17

Selective formation and alignment of InAs quantum dots over mesa stripes along the [011] and [001] directions on GaAs (100) substrates

R. Zhang, R. Tsui, K. Shiralagi et al. · Applied Physics Letters · 1998 · 41 citations

Engineering, Electrical Engineering, Materials Science +17

Effects of etch barrier densification on step and flash imprint lithography

Steve Johnson, Ryan L. Burns, E. K. Kim et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2005 · 38 citations

Natural Sciences, Materials Engineering, Materials Science +17