N. J. Gaspard

The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

Nathaniel A. Dodds, M.J. Martinez, P.E. Dodd et al. · IEEE Transactions on Nuclear Science · 2015 · 83 citations · Full text

Engineering, Nuclear Physics, Secondary Protons +18

Single-Event Performance and Layout Optimization of Flip-Flops in a 28-nm Bulk Technology

K. Lilja, M. Bounasser, Shi-Jie Wen et al. · IEEE Transactions on Nuclear Science · 2013 · 74 citations · Full text

Heavy-ion Single-event Measurements, Engineering, Vlsi Design +18

Electron-Induced Single-Event Upsets in Static Random Access Memory

M. King, Robert A. Reed, Robert A. Weller et al. · IEEE Transactions on Nuclear Science · 2013 · 69 citations

Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

S. Jagannathan, T. D. Loveless, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2012 · 58 citations

Engineering, Vlsi Design, Upset Mechanism +16

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

N. M. Atkinson, Jonathan R. Ahlbin, Arthur F. Witulski et al. · IEEE Transactions on Nuclear Science · 2011 · 54 citations

Device Modeling, Low-power Electronics, Electrical Engineering +15