O. Musseau

Publications

1.3K

Citations

H-Index

1988

Active since

Affiliations

Commissariat à l'Énergie Atomique et aux Énergies Alternatives(Current)

CEA DAM Île-de-France

CEA Grenoble

United States Naval Research Laboratory

Laboratoire d'Électronique des Technologies de l'Information

O. Musseau is an author at Commissariat à l'Énergie Atomique et aux Énergies Alternatives specializing in applied physics, microelectronics, and engineering.

Top concepts

EngineeringElectrical EngineeringMicroelectronicsApplied PhysicsPhysicsNanoelectronicsVlsi DesignComputer EngineeringElectronic EngineeringSingle Event Effects

Publications per year

1988–2005

Publications

Worst-case bias during total dose irradiation of SOI transistors

V. Ferlet-Cavrois, T. Colladant, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2000 · 134 citations · Full text

Electrical Engineering, Charge Trapping, Total Dose Irradiation +7

Single-event effects in SOI technologies and devices

O. Musseau · IEEE Transactions on Nuclear Science · 1996 · 113 citations

Event-driven Architecture, Engineering, Vlsi Design +19

Heavy ion and proton-induced single event multiple upset

Robert A. Reed, Martin A. Carts, Paul W. Marshall et al. · IEEE Transactions on Nuclear Science · 1997 · 103 citations

Engineering, Nuclear Physics, Logic States +18

Two-dimensional simulation of total dose effects on NMOSFET with lateral parasitic transistor

C. Brisset, V. Ferlet-Cavrois, O. Flament et al. · IEEE Transactions on Nuclear Science · 1996 · 92 citations

Device Modeling, Electrical Engineering, Conventional Nmosfet +13

Impact of ion energy on single-event upset

P.E. Dodd, O. Musseau, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 1998 · 90 citations

Electrical Engineering, Engineering, Vlsi Design +10

Rows per page

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