Concepedia

Author

O. Flament

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Also Known As

O Flament, O. Flament, Olivier Flament

78

Publications

1.4K

Citations

23

H-Index

78

Concepts

All Affiliations

Commissariat à l'Énergie Atomique et aux Énergies AlternativesCEA DAM Île-de-FranceCEA GrenobleSandia National LaboratoriesCentre National de la Recherche Scientifique
OF

About

O. Flament is an author at Commissariat à l'Énergie Atomique et aux Énergies Alternatives specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

23

39

1.3K

2

Natural Sciences

6

6

217

3

Education

2

2

34

4

Medicine

2

2

110

5

Health Sciences

1

1

58

O. Flament

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39

Publications

1.3K

Citations

23

H-Index

YearCitations

Two-dimensional simulation of total dose effects on NMOSFET with lateral parasitic transistor

C. Brisset, V. Ferlet-Cavrois, O. Flament,

IEEE Transactions on Nuclear Science

1996

92

Insights on the transient response of fully and partially depleted SOI technologies under heavy-ion and dose-rate irradiations

V. Ferlet-Cavrois, Gilles Gasiot, C. Marcandella,

IEEE Transactions on Nuclear Science

2002

89

Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation

M. Ceschia, A. Paccagnella, Simone Sandrin,

IEEE Transactions on Nuclear Science

2000

76

Total dose induced latch in short channel NMOS/SOI transistors

V. Ferlet-Cavrois, Sébastien Quoizola, O. Musseau,

IEEE Transactions on Nuclear Science

1998

58

Bias dependence of FD transistor response to total dose irradiation

O. Flament, A. Torres, V. Ferlet-Cavrois

IEEE Transactions on Nuclear Science

2003

58

Effects of isochronal annealing and irradiation temperature on radiation-induced trapped charge

Daniel M. Fleetwood, P.S. Winokur, M.R. Shaneyfelt,

IEEE Transactions on Nuclear Science

1998

54

Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct Ionization

M. Raine, Marc Gaillardin, Jean-Etienne Sauvestre,

IEEE Transactions on Nuclear Science

2010

50

Study of transient current induced by heavy-ion in NMOS/SOI transistors

T. Colladant, O. Flament, A. L’Hoir,

IEEE Transactions on Nuclear Science

2002

47

Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments

Damien Lambert, J. Baggio, V. Ferlet-Cavrois,

IEEE Transactions on Nuclear Science

2004

46

Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method

J. Baggio, V. Ferlet-Cavrois, H. Duarte,

IEEE Transactions on Nuclear Science

2004

44

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