M. Ceschia

Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

M. Ceschia, A. Paccagnella, Andrea Cester et al. · IEEE Transactions on Nuclear Science · 1998 · 165 citations

Electrical Engineering, Ion Implantation, Engineering +14

Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs

M. Ceschia, M. Violante, M. Sonza Reorda et al. · IEEE Transactions on Nuclear Science · 2003 · 121 citations

Engineering, Fpga Look-up Table, Mem Testing +17

Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation

M. Ceschia, A. Paccagnella, Simone Sandrin et al. · IEEE Transactions on Nuclear Science · 2000 · 76 citations

Electrical Engineering, Ion Implantation, Engineering +15

A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

Luca Larcher, A. Paccagnella, M. Ceschia et al. · IEEE Transactions on Nuclear Science · 1999 · 71 citations

Device Modeling, Trap Distribution, Electrical Engineering +14

Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA

M. Bellato, Paolo Bernardi, D. Bortolato et al. · Proceedings Design, Automation and Test in Europe Conference and Exhibition · 2004 · 65 citations

Hardware Security, Memory Architecture, Engineering +15