Concepedia
Statistics
Publications
6
Citations
150
H-Index
Active since
2019
Affiliations
IMEC(Current)
KU Leuven
TU Wien
D. Claes is an author at IMEC specializing in defects in electronic materials, semiconductor reliability, and semiconductor devices.
Publications per year
2019–2023
Understanding and modelling the PBTI reliability of thin-film IGZO transistors
Adrian Chasin, J. Franco, K. Triantopoulos et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 72 citations
Engineering, Electrical Engineering, Physics +17
Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · Microelectronics Reliability · 2023 · 34 citations · Full text
Chemical vapor deposition of monolayer-thin WS2 crystals from the WF6 and H2S precursors at low deposition temperature
Benjamin Groven, D. Claes, Ankit Nalin Mehta et al. · The Journal of Chemical Physics · 2019 · 13 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO<sub>2</sub> with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
J. Franco, Jean‐François de Marneffe, A. Vandooren et al. · 2020 · 11 citations
Engineering, Electrical Engineering, Materials Science +17
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
G. Rzepa, M. Karner, O. Baumgartner et al. · 2021 · 10 citations
Engineering, Computer Engineering, Electrical Engineering +14
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