J. Mandelman

Challenges and future directions for the scaling of dynamic random-access memory (DRAM)

J. Mandelman, R.H. Dennard, G. Bronner et al. · IBM Journal of Research and Development · 2002 · 262 citations

Non-volatile Memory, Engineering, Dynamic Random-access Memory +16

The current-carrying corner inherent to trench isolation

A. Bryant, Wilfried Haensch, J. Mandelman et al. · IEEE Electron Device Letters · 1993 · 35 citations

Geotechnical Engineering, Device Modeling, Electrical Engineering +11

The use of simulation in semiconductor technology development

Daniel C. Cole, E. M. Buturla, S. Furkay et al. · Solid-State Electronics · 1990 · 31 citations

Engineering, Process Simulation Model, Software Process Simulation +7

Dynamic Threshold Body- And Gate-coupled Soi Esd Protection Networks

Steven H. Voldman, F. Assaderaghi, J. Mandelman et al. · 1997 · 22 citations

Hardware Security, Low-power Electronics, Electrical Engineering +12

Numerical modeling of advanced semiconductor devices

W. Lee, S.E. Laux, Massimo V. Fischetti et al. · IBM Journal of Research and Development · 1992 · 18 citations

Numerical Analysis, Engineering, Semiconductor Device +17