E. Pion

NBTI degradation: From transistor to SRAM arrays

V. Huard, C. Parthasarathy, C. Guérin et al. · 2008 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +13

CMOS device design-in reliability approach in advanced nodes

Vincent Huard, CR Parthasarathy, A. Bravaix et al. · 2009 · 71 citations

Engineering, Computer Engineering, Electrical Engineering +16

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

D. Angot, V. Huard, Lama Rahhal et al. · 2013 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Managing SRAM reliability from bitcell to library level

Vincent Huard, Remy Chevallier, C. Parthasarathy et al. · 2010 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +17

A predictive bottom-up hierarchical approach to digital system reliability

V. Huard, E. Pion, F. Cacho et al. · 2012 · 29 citations

Engineering, Electrical Engineering, Systems Engineering +17