2009 · 71 citations · 6 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesCmos Circuit DesignDevice CharacterizationDevice ModelingDevice ReliabilityReliability ModelingSemiconductor ReliabilityAging CharacterizationCmos ReliabilityDevice DegradationGate Oxide DegradationReliability DegradationReliability Degradation AnalysisReliability PhysicsReliability Simulation
A general framework is proposed to characterize digital library gates for NBTI and HCI ageing effects. Required parameters extraction is demonstrated for practical cases using accurate, state-of-the-art reliability simulation flow. Both NBTI recovery and HCI models are required to accurately assess digital product degradation.
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MOS transistor reliability under analog operation
R. Thewes, Ralf Brederlow, Christian Schlünder et al. · Microelectronics Reliability · 2000 · 32 citations
Engineering, Electrical Engineering, Electronic Materials +13