28nm FDSOI technology platform for high-speed low-voltage digital applications

N. Planes, O. Weber, V. Barral, +29

EngineeringVlsi DesignEmerging Memory TechnologyComputer ArchitectureHardware Systems +14

3DVLSI with CoolCube process: An alternative path to scaling

P. Batude, C. Fenouillet-Béranger, L. Pasini, +47

EngineeringVlsi DesignComputer ArchitectureComputer-aided DesignOptoelectronic Devices +21

High performance UTBB FDSOI devices featuring 20nm gate length for 14nm node and beyond

Qianlong Liu, M. Vinet, J. Gimbert, +36

Semiconductor TechnologyElectrical EngineeringGate LengthEngineeringVlsi Design +13

14nm FDSOI technology for high speed and energy efficient applications

O. Weber, E. Josse, F. Andrieu, +62

Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignHigh-speed Electronics +7

Analysis of width edge effects in advanced isolation schemes for deep submicron CMOS technologies

P. Sallagoity, M. Ada-Hanifi, M. Paoli, +1

IEEE Transactions on Electron Devices

Electrical EngineeringAdvanced Isolation SchemesEngineeringVlsi DesignCorner Parasitic Transistor +6

50 nm-Gate All Around (GAA)-Silicon On Nothing (SON)-devices: a simple way to co-integration of GAA transistors within bulk MOSFET process

S. Monfray, T. Skotnicki, Y. Morand, +14

Electrical EngineeringEngineeringRf SemiconductorBulk DevicesNanoelectronics +11

Assessment of 28 nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements

Babak Kazemi Esfeh, Valeriya Kilchytska, V. Barral, +4

Solid-State Electronics

Electrical EngineeringRf ApplicationsEngineeringRadio FrequencyRf Semiconductor +9

Halogen lamp recrystallization of silicon on insulating substrates

D.P. Vu, M. Haond, D. Bensahel, +1

Journal of Applied Physics

Materials ScienceSemiconductorsOptical MaterialsEngineeringWafer Scale Processing +12

First 80 nm SON (Silicon-On-Nothing) MOSFETs with perfect morphology and high electrical performance

S. Monfray, T. Skotnicki, Y. Morand, +13

Device ModelingHigh Electrical PerformanceElectrical EngineeringPhysical Design (Electronics)Engineering +13

Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

E.G. Ioannidis, S. Haendler, A. Bajolet, +11

Electrical EngineeringFd-soi Cmos TransistorsBulk Cmos TechnologiesVlsi DesignEngineering +10