2015 · 136 citations · 6 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignDevice ScalingIii-v SemiconductorsIntegrated Circuit DesignSemiconductor Device MaterialsThermal Properties Of SemiconductorsVery-large-scale Integration LayoutBondingDirect Wafer BondingDopant ActivationStackingThermal Management Of Semiconductor DevicesThree-dimensional Integration
3D VLSI with a CoolCube™ integration allows vertically stacking several layers of devices with a unique connecting via density above a million/mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> . This results in increased density with no extra cost associated to transistor scaling, while benefiting from gains in power and performance thanks to wire-length reduction. CoolCube™ technology leads to high performance top transistors with Thermal Budgets (TB) compatible with bottom MOSFET integrity. Key enablers are the dopant activation by Solid Phase Epitaxy (SPE) or nanosecond laser anneal, low temperature epitaxy, low k spacers and direct bonding. New data on the maximal TB bottom MOSFET can withstand (with high temperatures but short durations) offer new opportunities for top MOSFET process optimization.
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2014 Symposium on VLSI Technology
IEEE Journal of Solid-State Circuits · 2014 · 137 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +12
P. Batude, T. Ernst, Julien Arcamone et al. · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2012 · 109 citations