M. Ada-Hanifi

Analysis of width edge effects in advanced isolation schemes for deep submicron CMOS technologies

P. Sallagoity, M. Ada-Hanifi, M. Paoli et al. · IEEE Transactions on Electron Devices · 1996 · 87 citations

Engineering, Electrical Engineering, Microelectronics +16

A model of conduction in polycrystalline silicon films

M. Ada-Hanifi, Jean Emmanuel Sicart, Jean-Michel Dusseau et al. · Journal of Applied Physics · 1987 · 18 citations

Engineering, Materials Science, Physics +17

Leakage mechanisms of titanium silicided <i>n</i>+/<i>p</i> junctions fabricated using rapid thermal processing

M. Ada-Hanifi, A. Chantre, Davide Levy et al. · Applied Physics Letters · 1991 · 15 citations

Engineering, Electrical Engineering, Materials Science +17