James M. Never

Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy

Albert K. Henning, Todd Hochwitz, J. Slinkman et al. · Journal of Applied Physics · 1995 · 182 citations

Engineering, Materials Engineering, Materials Science +17

Imaging integrated circuit dopant profiles with the force-based scanning Kelvin probe microscope

Todd Hochwitz, Albert K. Henning, Chris Levey et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 51 citations

Engineering, Electrical Engineering, Materials Science +17

Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry

Steven H. Voldman, V. Gross, M. Hargrove et al. · Journal of Electrostatics · 1993 · 35 citations

Engineering, Electrical Engineering, Microelectronics +3

Failure analysis of shallow trench isolated ESD structures

James M. Never, Steven H. Voldman · 1995 · 23 citations

Engineering, Electrical Engineering, Microelectronics +10

Linewidth control effects on MOSFET ESD robustness

Steven H. Voldman, James M. Never, Steven J. Holmes et al. · 2005 · 21 citations

Engineering, Design, Electrical Engineering +17