Todd Hochwitz - Concepedia

Author

Todd Hochwitz

Also Known As

T. Hochwitz, Todd Hochwitz

Publications

356

Citations

H-Index

Concepts

All Affiliations

Todd Hochwitz is an author at Dartmouth College specializing in microelectronics, microscopy, and electrical engineering.

#	Concept	H-Index	Publications	Citations
1	Engineering	4	4	353
2	Applied Physics	4	4	353
3	Electrical Engineering	4	4	353
4	Materials Science	2	2	215
5	Medicine	1	1	87

Todd Hochwitz

Publications

353

Citations

H-Index

Page 1

	Year	Citations
Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy Albert K. Henning, Todd Hochwitz, J. Slinkman, Journal of Applied Physics EngineeringMicroscopySilicon On InsulatorDopant ConcentrationsSemiconductor Device	1995	180
Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes Todd Hochwitz, Albert K. Henning, Chris Levey, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyMechanical EngineeringElectrostatic ForceInitial Data Analysis	1996	87
Imaging integrated circuit dopant profiles with the force-based scanning Kelvin probe microscope Todd Hochwitz, Albert K. Henning, Chris Levey, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyElectrostatic ForceIntegrated CircuitsSemiconductor Device	1996	51
Scanning probe microscopy for 2-D semiconductor dopant profiling and device failure analysis Alex Henning, Todd Hochwitz Materials Science and Engineering B EngineeringMicroscopySemiconductor DeviceAtomic Force MicroscopeNanometrology	1996	35

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