Concepedia

Todd Hochwitz

TH

4

Publications

353

Citations

4

H-Index

1995

Active since

Affiliations

Dartmouth College(Current)

Todd Hochwitz is an author at Dartmouth College specializing in microelectronics, microscopy, and electrical engineering.

Top concepts

Publications per year

1995–1996

4

Publications

4

Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy

Albert K. Henning, Todd Hochwitz, J. Slinkman et al. · Journal of Applied Physics · 1995 · 180 citations

, , +19

Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes

Todd Hochwitz, Albert K. Henning, Chris Levey et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 87 citations

, , +22

Imaging integrated circuit dopant profiles with the force-based scanning Kelvin probe microscope

Todd Hochwitz, Albert K. Henning, Chris Levey et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 51 citations

, , +18

Scanning probe microscopy for 2-D semiconductor dopant profiling and device failure analysis

Alex Henning, Todd Hochwitz · Materials Science and Engineering B · 1996 · 35 citations · Full text

, , +25

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