Ryan Lu

5nm CMOS Production Technology Platform featuring full-fledged EUV, and High Mobility Channel FinFETs with densest 0.021µm² SRAM cells for Mobile SoC and High Performance Computing Applications

Geoffrey Yeap, S.S. Lin, Y. M. Chen et al. · 2019 · 93 citations

Engineering, Electrical Engineering, High-performance Computing +13

Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown

Yung-Huei Lee, Neal Mielke, Sukirti Gupta et al. · 2006 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +17

Reliability characterization of 32nm high-K and Metal-Gate logic transistor technology

Sangwoo Pae, Ashwin Ashok, T. Ghani et al. · 2010 · 59 citations

Engineering, Electrical Engineering, Electronic Materials +16

Additive manufacturing of graded B4C-Al cermets with complex shapes

Swetha Chandrasekaran, Ryan Lu, R.L. Landingham et al. · Materials & Design · 2020 · 43 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Scanning spreading resistance microscopy current transport studies on doped III–V semiconductors

Ryan Lu, K. L. Kavanagh, St. J. Dixon-Warren et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002 · 41 citations

Engineering, Electrical Engineering, Materials Science +17