Statistics
Publications
17
Citations
499
H-Index
15
Active since
2001
Ryan Lu is an author at Lawrence Livermore National Laboratory specializing in engineering, electrical engineering, and microelectronics.
Publications per year
2001–2021
17
17
Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown
Yung-Huei Lee, Neal Mielke, M. Agostinelli et al. · 2006 · 60 citations
Reliability, Electrical Engineering, Reliability Engineering +15
Additive manufacturing of graded B4C-Al cermets with complex shapes
Swetha Chandrasekaran, Ryan Lu, R.L. Landingham et al. · Materials & Design · 2020 · 41 citations · Full text
Scanning spreading resistance microscopy current transport studies on doped III–V semiconductors
Ryan Lu, K. L. Kavanagh, St. J. Dixon-Warren et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002 · 40 citations
Contact Barrier Heights, Wide-bandgap Semiconductor, Engineering +17
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