B.A. Randall

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2000 · 108 citations

Engineering, Computer Engineering, Electrical Engineering +17

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 100 citations

Engineering, Computer Engineering, Electrical Engineering +13

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Electrical Engineering, Electronic Materials +15

An SEU hardening approach for high-speed SiGe HBT digital logic

R. Krithivasan, Guofu Niu, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2003 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +17

Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

Ramkumar Krithivasan, Paul W. Marshall, Mustayeen B. Nayeem et al. · IEEE Transactions on Nuclear Science · 2006 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +13