Guofu Niu

Design and fabrication of planar guard ring termination for high-voltage SiC diodes

David C. Sheridan, Guofu Niu, J. Neil Merrett et al. · Solid-State Electronics · 2000 · 122 citations

Electrical Engineering, Engineering, High Voltage Engineering +5

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 99 citations

Engineering, Vlsi Design, Mem Testing +17

RF linearity characteristics of SiGe HBTs

Guofu Niu, Qingqing Liang, John D. Cressler et al. · IEEE Transactions on Microwave Theory and Techniques · 2001 · 96 citations

Electrical Engineering, Semiconductor Device, Engineering +13

A unified approach to RF and microwave noise parameter modeling in bipolar transistors

Guofu Niu, John D. Cressler, Shiming Zhang et al. · IEEE Transactions on Electron Devices · 2001 · 92 citations

Device Modeling, Electrical Engineering, Engineering +15

Noise in SiGe HBT RF Technology: Physics, Modeling, and Circuit Implications

Guofu Niu · Proceedings of the IEEE · 2005 · 87 citations

Electrical Engineering, Engineering, Rf Semiconductor +14