R. Krithivasan

Half-terahertz operation of SiGe HBTs

R. Krithivasan, Yuan Lu, John D. Cressler et al. · IEEE Electron Device Letters · 2006 · 101 citations

Electrical Engineering, Millimeter Wave Technology, Engineering +12

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 99 citations

Engineering, Vlsi Design, Mem Testing +17

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Vlsi Design, Single-event Upsets +17

An investigation of the origins of the variable proton tolerance in multiple SiGe HBT BiCMOS technology generations

John D. Cressler, R. Krithivasan, Gang Zhang et al. · IEEE Transactions on Nuclear Science · 2002 · 67 citations

Device Modeling, Defect Tolerance, Electrical Engineering +14

An SEU hardening approach for high-speed SiGe HBT digital logic

R. Krithivasan, Guofu Niu, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2003 · 54 citations

Hardware Security, Low-power Electronics, Electrical Engineering +14