Concepedia

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor

Microelectronics Reliability · 2015 · 25 citations · 20 references

DOI

Concepts

References

20

Multivariate Adaptive Regression Splines

Jerome H. Friedman · The Annals of Statistics · 1991 · 8.1K citations · Full text

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Statistics for Experimenters

Sidney Addelman, G. E. P. Box, W. G. Hunter et al. · Technometrics · 1979 · 6.5K citations

Percolation models for gate oxide breakdown

J. H. Stathis · Journal of Applied Physics · 1999 · 528 citations

, , +17

Statistics for Experimenters

I. Elaine Allen · Quality progress · 2006 · 476 citations

Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

Wenping Wang, V. Reddy, A.T. Krishnan et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 360 citations

, , +17