Taizhi Liu

System-level modeling of microprocessor reliability degradation due to BTI and HCI

Chang-Chih Chen, Soonyoung Cha, Taizhi Liu et al. · 2014 · 29 citations

Engineering, Computer Architecture, System Reliability +20

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Taizhi Liu, Chang-Chih Chen, Soonyoung Cha et al. · Microelectronics Reliability · 2015 · 25 citations

Device Modeling, Hot Carrier Injection, Electrical Engineering +9

System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

Chang-Chih Chen, Taizhi Liu, Linda Milor · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2016 · 22 citations

Engineering, Vlsi Design, Computer Architecture +20

SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection

Taizhi Liu, Chang-Chih Chen, Jiadong Wu et al. · 2016 · 22 citations

Hardware Security, Hot Carrier Injection, Electrical Engineering +15

Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors

Taizhi Liu, Chang-Chih Chen, Linda Milor · IEEE Transactions on Emerging Topics in Computing · 2016 · 20 citations

Engineering, Industrial Engineering, Computer Architecture +18