Characterization of CdTe Growth on GaAs Using Different Etching Techniques

Raman scattering study of the properties and removal of excess Te on CdTe surfaces

P. M. Amirtharaj, Fred H. Pollak · Applied Physics Letters · 1984 · 237 citations

Engineering, Surface-enhanced Raman Scattering, Surface Nanotechnology +18

Effect of dislocations on the electrical and optical properties of long-wavelength infrared HgCdTe photovoltaic detectors

S. M. Johnson, David R. Rhiger, J. P. Rosbeck et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1992 · 205 citations

Optical Materials, Engineering, Photovoltaics +20

Observation of dislocations in cadmium telluride by cathodoluminescence microscopy

Kiyokazu Nakagawa, K. Maeda, Shoji Takeuchi · Applied Physics Letters · 1979 · 189 citations

Materials Science, Materials Engineering, Ii-vi Semiconductor +12

Etch pit characterization of CdTe and CdZnTe substrates for use in mercury cadmium telluride epitaxy

W. J. Everson, Christopher Ard, J. L. Sepich et al. · Journal of Electronic Materials · 1995 · 149 citations

Materials Science, Cdznte Substrates, Chemistry +1

Crystallographic polarity and etching of cadmium telluride

Paul F. Fewster, P.A.C. Whiffin · Journal of Applied Physics · 1983 · 64 citations

Materials Science, Ii-vi Semiconductor, Cadmium Telluride +12