Observation of dislocations in cadmium telluride by cathodoluminescence microscopy

Abstract

A one-to-one correspondence between deformation-produced dark spots in cathodoluminescence (CL) micrographs and dislocations has been demonstrated in n-type CdTe by comparing the CL pattern with the etch-pit pattern developed with a new etchant which has been ascertained to reveal dislocations by a successive polishing and etching method.