Applied Physics Letters · 1979 · 189 citations · 15 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSurface ScienceDislocations In SemiconductorsSemiconductor DefectsSemiconductor Device MaterialsSemiconductor SurfacesCadmium TellurideCathodoluminescence MicroscopyDislocation BehaviorDislocation CharacterizationDislocation PhysicsDislocation Structure AnalysisDislocationsPolishing
A one-to-one correspondence between deformation-produced dark spots in cathodoluminescence (CL) micrographs and dislocations has been demonstrated in n-type CdTe by comparing the CL pattern with the etch-pit pattern developed with a new etchant which has been ascertained to reveal dislocations by a successive polishing and etching method.
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Photoluminescence at Dislocations in GaAs
W. Heinke, H. J. Queisser · Physical Review Letters · 1974 · 84 citations