Raman scattering study of the properties and removal of excess Te on CdTe surfaces

Abstract

We have studied Raman scattering from CdTe 〈100〉, 〈110〉, and 〈111〉 surfaces subjected to various surface treatments. Our investigation shows that 0.1% Br/methanol etch or chemomechanical polish leaves a thin residual layer of polycrystalline Te of thickness 10–40 Å (under a tensile stress of about 8 kbar) and that this Te film can be removed by a rinse in a 1 N KOH in methanol solution.