2009 · 13 citations · 13 references
EngineeringAerospace EngineeringElectrical EngineeringAvionicsMicroelectronicsSemiconductor DevicesAircraft Electrical SystemsCondition MonitoringDevice CharacterizationDevice ReliabilitySemiconductor ReliabilityThermal ManagementAccelerated Aging TestsAging TestsPrognosticsRemaining Useful Life PredictionSteady-state CurrentSystem Health ManagementThermal CyclingThermal Transients In Electronics
Abstract—Electronics components have and increasingly critical role in avionics systems and for the development of future aircraft systems. Prognostics of such components is becoming a very important research filed as a result of the need to provide aircraft systems with system level health management. This paper reports on a prognostics application for electronics components of avionics systems, in particular, its application to the Isolated Gate Bipolar Transistor (IGBT). The remaining useful life prediction for the IGBT is based on the particle filter framework, leveraging data from an accelerated aging tests on IGBTs. The accelerated aging test provided thermal-electrical overstress by applying thermal cycling to the device. In-situ state monitoring, including measurements of the steadystate voltages and currents, electrical transients, and thermal
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Dielectric breakdown mechanisms in gate oxides
S. Lombardo, J. H. Stathis, B.P. Linder et al. · Journal of Applied Physics · 2005 · 437 citations