Integration · 2015 · 52 citations · 41 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignCurrent-voltage CharacteristicsDevice ScalingIntegrated Circuit DesignLeakage Power ReductionVoltage ScalingGate Oxide LeakageLeakage Current ModelingLeakage Current ReductionLeakage Power OptimizationLeakage Recovery TechniquesLeakage-constrained Circuit Design
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A sub-130-nm conditional keeper technique
Atila Alvandpour, Ram Krishnamurthy, K. Soumyanath et al. · IEEE Journal of Solid-State Circuits · 2002 · 199 citations
Engineering, Computer Engineering, Electrical Engineering +17