Microelectronics Journal · 2023 · 15 citations · 18 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesDevice Noise CharacterizationLinearityLow-frequency NoiseMosfet NoiseNoise CharacteristicsNoise In Field-effect TransistorsNoise In Metal-oxide-semiconductor Field-effect TransistorsNoise Parameters
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The effect of gate leakage on the noise figure of AlGaN/GaN HEMTs
C. Sanabria, A. Chakraborty, Hongtao Xu et al. · IEEE Electron Device Letters · 2005 · 114 citations · Full text