Noise Characteristics

Noise Characteristics is a metric that quantifies the statistical fluctuations and unwanted variations in the output signal of a device, distinguishing it by characterizing the inherent temporal and spectral properties of noise in field-effect transistors, laser diodes, and thin-film transistors under operational conditions.

1.9K

Publications

84.2K

Citations

9.5K

Authors

1.7K

Institutions

Publications per year

2017–2026

368

Authors

9.5K

  1. JC
    Joe C. Campbell

    The University of Texas at Austin, United States

    11 publications · 897 citations

    10

    h-index

  2. JL
    Jong‐Ho Lee

    Seoul National University, South Korea

    10 publications · 310 citations

    9

    h-index

  3. RT
    R.C. Tozer

    University of Sheffield, United Kingdom

    9 publications · 318 citations

    9

    h-index

  4. SC
    Shoou‐Jinn Chang

    National Cheng Kung University, Taiwan

    9 publications · 199 citations

    9

    h-index

  5. GR
    G.J. Rees

    University of Sheffield, United Kingdom

    8 publications · 288 citations

    8

    h-index

1–5 of 9.5K

Venues

  1. IEEE Transactions on Electron Devices

    72 publications · 3.1K citations

    31

    h-index

  2. Applied Physics Letters

    59 publications · 2.3K citations

    29

    h-index

  3. IEEE Journal of Quantum Electronics

    43 publications · 2.2K citations

    29

    h-index

  4. Journal of Applied Physics

    46 publications · 1.5K citations

    22

    h-index

  5. IEEE Electron Device Letters

    40 publications · 1.2K citations

    22

    h-index

1–5