Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs

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Composition dependence of photoluminescence of GaAs1−xBix alloys

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The effect of gate leakage on the noise figure of AlGaN/GaN HEMTs

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Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes

V. Bharath Sreenivasulu, Narendar Vadthiya · Microelectronics Journal · 2021 · 69 citations

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