Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 · 2013 · 13 citations · 0 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureBuilt-in Self-testDesign For TestabilityDigital Logic DesignLogic SynthesisTiming AnalysisAnalog-to-digital ConversionAnalog-to-digital ConvertersAutomatic Test Pattern GenerationClock Domain CrossingClock Domain DesignLogic Built-in Self-testTest Generation
Unknown (X) values may emerge during the design process as well as during system operation and test application. Sources of X-values are for example black boxes, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements.