Concepedia

Publication | Closed Access

Cobalt and Ruthenium drift in ultra-thin oxides

DOI

13

Citations

20

References

2019

Year

Davide Tierno, Olalla Varela Pedreira, Chen Wu, N. Jourdan, Luka Ključar, Zs. Tôkei, Kristof Croes
Microelectronics Reliability

References

YearCitations

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