Davide Tierno

Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study

Divya Prasad, Manoj Vangala, Mudit Bhargava et al. · 2022 International Electron Devices Meeting (IEDM) · 2022 · 18 citations

Electrical Engineering, Engineering, Vlsi Design +14

Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill

A. Leśniewska, Ph. Roussel, Davide Tierno et al. · 2020 · 14 citations

Engineering, Dielectric Reliability Performance, Interconnect (Integrated Circuits) +19

Cobalt and Ruthenium drift in ultra-thin oxides

Davide Tierno, Olalla Varela Pedreira, Chen Wu et al. · Microelectronics Reliability · 2019 · 13 citations

Materials Science, Engineering, Oxide Electronics +3

Reliability of Barrierless PVD Mo

Davide Tierno, Motaharesadat Hosseini, M. van der Veen et al. · 2021 · 11 citations

Materials Science, Barrierless Mo Metallization, Electrical Engineering +14

Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films

Davide Tierno, Matthijn Dekkers, Paul Wittendorp et al. · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 2018 · 10 citations · Full text