Microelectronic Engineering · 2019 · 16 citations · 16 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsIii-v SemiconductorsSemiconductor Device MaterialsSemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsGallium NitrideGallium Nitride (Gan) MaterialsGeneration-recombination NoiseNoise CharacteristicsNoise In Heterostructure DevicesNoise In High-frequency Semiconductor DevicesNoise Sources In Semiconductor Materials
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Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors
G. Ghibaudo, O. Roux, Ch. Nguyen-Duc et al. · physica status solidi (a) · 1991 · 759 citations
C. Hilsum · Journal of Physics and Chemistry of Solids · 1958 · 616 citations