An efficient EDAC approach for handling multiple bit upsets in memory array

A class of multiple-error-correcting codes and the decoding scheme

I.S. Reed · Transactions of the IRE Professional Group on Information Theory · 1954 · 852 citations

Engineering, Computer Science, Electrical Engineering +17

Impact of CMOS technology scaling on the atmospheric neutron soft error rate

P. Hazucha, C. Svensson · IEEE Transactions on Nuclear Science · 2000 · 595 citations

Engineering, Computer Engineering, Electrical Engineering +17

Investigation of multi-bit upsets in a 150 nm technology SRAM device

D. Radaelli, H. Puchner, Sven Daniel · IEEE Transactions on Nuclear Science · 2005 · 182 citations

Engineering, Computer Engineering, Electrical Engineering +17

Cosmic Ray Induced in MOS Memory Cells

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1978 · 176 citations

Engineering, Computer Engineering, Electrical Engineering +15

SEU-tolerant SRAM design based on current monitoring

Fabian Vargas, M. Nicolaidis · 2002 · 116 citations

Engineering, Computer Engineering, Electrical Engineering +17