D. Radaelli

Investigation of multi-bit upsets in a 150 nm technology SRAM device

D. Radaelli, H. Puchner, S. Wong et al. · IEEE Transactions on Nuclear Science · 2005 · 178 citations

Engineering, Mem Testing, Computer Architecture +16

Alpha-particle SEU performance of SRAM with triple well

H. Puchner, D. Radaelli, Ahmad R. Chatila · IEEE Transactions on Nuclear Science · 2004 · 37 citations

Materials Engineering, Triple-well Scheme, Electrical Engineering +15

Process impact on SRAM alpha-particle SEU performance

Yue Xu, H. Puchner, Ahmad R. Chatila et al. · 2004 · 32 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +13

Neutron Induced Micro SEL Events in COTS SRAM Devices

Jake Tausch, D. Sleeter, D. Radaelli et al. · 2007 · 31 citations

Hardware Security, Electrical Engineering, Engineering +12

Determination of Geometry and Absorption Effects and Their Impact on the Accuracy of Alpha Particle Soft Error Rate Extrapolations

R. Baumann, D. Radaelli · IEEE Transactions on Nuclear Science · 2007 · 25 citations

Engineering, Measurement, Experimental Technology +17