Concepedia

Bit Flip Fault Models

Bit Flip Fault Models is a fault modeling framework in computer systems that represents the class of hardware-level error injection techniques by characterizing faults as single or multiple bit inversions in storage or transmission media to simulate and analyze the effects of transient hardware faults.

48

Publications

1.4K

Citations

186

Authors

88

Institutions

Publications per year

2017–2026

8

Parents

Publications

48

Evaluating the Impact of SDC on the GMRES Iterative Solver

James John Elliott, Mark Frederick Hoemmen, Frank Mueller · 2014 · 83 citations · Full text

, , +16

Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells

Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre et al. · 2013 · 77 citations

, , +17

Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM

Kevin M. Warren, Robert A. Weller, Brian D. Sierawski et al. · IEEE Transactions on Nuclear Science · 2007 · 75 citations

, , +16

Transient fault models and AVF estimation revisited

Nisha George, Carl Elks, B.W. Johnson et al. · 2010 · 75 citations

, , +17

Software detection mechanisms providing full coverage against single bit-flip faults

Basarab Nicolescu, Y. Savaria, Raoul Velazco · IEEE Transactions on Nuclear Science · 2004 · 68 citations

, , +17

1–5 of 48

Authors

186

  1. SG
    Seyed Ghassem Miremadi

    Sharif University of Technology, Iran

    3 publications · 87 citations

    3

    h-index

  2. PG
    Pedro Gil

    Universitat Politècnica de València, Spain

    3 publications · 61 citations

    3

    h-index

  3. DG
    Daniel Gil

    Universitat Politècnica de València, Spain

    3 publications · 61 citations

    3

    h-index

  4. JR
    Juan–Carlos Ruiz

    Universitat Politècnica de València, Spain

    3 publications · 61 citations

    3

    h-index

  5. MF
    Mark Frederick Hoemmen

    Sandia National Laboratories, United States

    3 publications · 112 citations

    3

    h-index

1–5 of 186

Institutions

88

  1. Techniques of Informatics and Microelectronics for Integrated Systems Architecture

    Grenoble, France

    4 h-index

    8 publications

    213 citations

  2. Chalmers University of Technology

    Gothenburg, Sweden

    3 h-index

    10 publications

    235 citations

  3. Sharif University of Technology

    Tehran, Iran

    3 h-index

    12 publications

    348 citations

  4. Vanderbilt University

    Nashville, United States

    2 h-index

    13 publications

    799 citations

  5. Universidade Federal do Rio Grande do Sul

    Porto Alegre, Brazil

    2 h-index

    4 publications

    178 citations

  6. North Carolina State University

    Raleigh, United States

    2 h-index

    3 publications

    184 citations

  7. Centre National de la Recherche Scientifique

    Paris, France

    2 h-index

    5 publications

    185 citations

  8. University of Lethbridge

    Lethbridge, Canada

    2 h-index

    3 publications

    48 citations

1–8 of 88

Venues

  1. IEEE Transactions on Nuclear Science

    4 publications · 211 citations

    4

    h-index

  2. 2

    h-index

  3. IEEE Transactions on Computers

    2 publications · 30 citations

    2

    h-index

  4. Computers & Electrical Engineering

    2 publications · 47 citations

    2

    h-index

  5. Journal of Electronic Testing

    JETTA · 2 publications · 42 citations

    1

    h-index

1–5