Investigation on the effects of low-temperature anodic bonding and its reliability for MEMS packaging using destructive and non-destructive techniques

Robin Joyce, Minu George, Lokasani Bhanuprakash, Deepak Panwar, Ravi Bhatia, Soney Varghese, Jamil Akhtar

Journal of Materials Science Materials in Electronics · 2017 · 17 citations · 19 references

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