Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology

Radiation-induced soft errors in advanced semiconductor technologies

R. Baumann · IEEE Transactions on Device and Materials Reliability · 2005 · 1.4K citations

Engineering, Computer Engineering, Electrical Engineering +17

Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

Shekhar Borkar · IEEE Micro · 2005 · 1.3K citations

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Radiation-Induced Soft Errors in Advanced Semiconductor Technologies

Robert Baumann · IEEE Transactions on Device and Materials Reliability · 2005 · 976 citations

Engineering, Computer Engineering, Electrical Engineering +17

ASAP7: A 7-nm finFET predictive process design kit

Lawrence T. Clark, Vinay Vashishtha, L. Shifren et al. · Microelectronics Journal · 2016 · 736 citations · Full text

Engineering, Electrical Engineering, Microfabrication +13

Fault-Tolerance Techniques for SRAM-Based FPGAs

Ricardo P. Jasinski · The Computer Journal · 2006 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +17