IC SEE Comparative Studies at UCL and JINR Heavy Ion Accelerators

Abstract

The paper presents new experimental results for single event effects (SEL, SEU, SET) in modern ICs obtained at "U-400M" heavy ion accelerator (JINR, Dubna, Russia) and UCL heavy ion accelerator (UCL university, Louvain-la-Neuve, Belgium). Five digital and analog DUTs (Flash memory, FPGA, MIL-STD-1553 interface IC, operational amplifier and current sensor) were used in the experiment and comparison between UCL and JINR experimental results was done. The UCL and JINR experimental results and its Weibull approximation are in a good agreement for all SEE types.