Vladimir V. Emeliyanov

Design of 65 nm CMOS SRAM for Space Applications: A Comparative Study

Maxim S. Gorbunov, Pavel S. Dolotov, Andrey A. Antonov et al. · IEEE Transactions on Nuclear Science · 2014 · 53 citations

Low-power Electronics, Hardware Security, Electrical Engineering +14

Roscosmos facilities for SEE testing at U400M FLNR JINR cyclotron

Vasily S. Anashin, A. M. Chlenov, Vladimir V. Emeliyanov et al. · 2011 · 20 citations

Engineering, Nuclear Physics, Experimental Technology +17

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling

Gennady I. Zebrev, Alexander S. Vatuev, Rustem G. Useinov et al. · IEEE Transactions on Nuclear Science · 2014 · 20 citations

Device Modeling, Electrical Engineering, Single Heavy Ion +13

Statistics and methodology of multiple cell upset characterization under heavy ion irradiation

Gennady I. Zebrev, Maxim S. Gorbunov, Rustem G. Useinov et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2014 · 19 citations

Health Sciences, Radiation Effect, Radiation Exposure +7

Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods

Maxim S. Gorbunov, Boris V. Vasilegin, Andrey A. Antonov et al. · IEEE Transactions on Nuclear Science · 2012 · 17 citations

Laser Technique, Engineering, Vlsi Design +22