Automatic control system for memory chips performance in a radiation experiment

Abstract

The paper analyzes the effectiveness of test algorithms of different duration during the functional control of static random access memory (SRAM) during the exposure to total ionizin dose (TID). The results of experimental research SRAM chips using an automated system based on the equipment PXI company National Instruments, justifying the use of the test algorithms such as “MARCH” (long-10N).