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Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

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Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)

Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi et al. · 2011 · 69 citations

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