Journal of Computational and Theoretical Nanoscience · 2008 · 12 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesCmos Circuit DesignDevice CharacterizationDevice ModelingDevice ScalingDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsGate-dependent Current-voltage BehaviorMosfet ModelingProcess ParametersThreshold VoltageThreshold Voltage ExtractionThreshold Voltage ModelingThreshold Voltage Scaling