An Accurate Timing Model for Nano CMOS Circuit Considering Statistical Process Variation

Intrinsic MOSFET parameter fluctuations due to random dopant placement

Xinghai Tang, Vivek De, J.D. Meindl · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1997 · 254 citations

Engineering, Computer Engineering, Electrical Engineering +17

The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits

Marc-Thomas Eisele, J. Berthold, D. Schmitt‐Landsiedel et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1997 · 162 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance

Keith Bowman, Xinghai Tang, J.C. Eble et al. · IEEE Journal of Solid-State Circuits · 2000 · 77 citations

Engineering, Computer Engineering, Electrical Engineering +17

Signal Transient and Crosstalk Model of Capacitively and Inductively Coupled VLSI Interconnect Lines

Taehoon Kim, Dongchul Kim, Yungseon Eo · JSTS Journal of Semiconductor Technology and Science · 2007 · 19 citations

Engineering, Electrical Engineering, Circuit Theory +16