Journal of Electronic Testing · 2003 · 51 citations · 10 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureFault-tolerant ComputingBuilt-in Self-testDesign For TestabilityInstruction Set ArchitectureMulticore Processor DesignProcessor Core DesignProcessor MicroarchitectureHardware Verification Of Processor CoresLogic Built-in Self-testMicroprocessor Built-in Self-testSelf-test ArchitectureSelf-test Mechanisms
10
Logic BIST for large industrial designs: real issues and case studies
G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 284 citations
Engineering, Computer Engineering, Electrical Engineering +16
On the test of microprocessor IP cores
Fulvio Corno, M. Sonza Reorda, Giovanni Squillero et al. · 2001 · 71 citations
Engineering, Computer Engineering, Electrical Engineering +15