Concepedia

Self-test Mechanisms

Self-Test Mechanism is a built-in diagnostic procedure in automotive microcontrollers that autonomously verifies the functional integrity of internal hardware components to ensure reliability and safety in critical operations.

147

Publications

5K

Citations

394

Authors

138

Institutions

Publications per year

2017–2026

15

Parents

Publications

147

A tutorial on built-in self-test. I. Principles

Vishwani D. Agrawal, C.R. Kime, Kewal K. Saluja · IEEE Design & Test of Computers · 1993 · 269 citations

, , +12

Microprocessor Software-Based Self-Testing

Mihalis Psarakis, Dimitris Gizopoulos, Ernesto Sánchez et al. · IEEE Design & Test of Computers · 2010 · 256 citations

, , +15

Functional Testing of Microprocessors

Brahme, Abraham · IEEE Transactions on Computers · 1984 · 193 citations

, , +17

Comparison of AC self-testing procedures

Z. Barzilai, Barry K. Rosen · International Test Conference · 1983 · 148 citations

, , +11

Instruction randomization self test for processor cores

Kenneth William Batcher, C. Papachristou · 2003 · 131 citations

, , +16

1–5 of 147

Authors

394

  1. AP
    A. Paschalis

    National and Kapodistrian University of Athens, Greece

    10 publications · 398 citations

    10

    h-index

  2. DG
    Dimitris Gizopoulos

    National and Kapodistrian University of Athens, Greece

    10 publications · 639 citations

    10

    h-index

  3. MP
    Mihalis Psarakis

    University of Piraeus, Greece

    8 publications · 507 citations

    8

    h-index

  4. YZ
    Y. Zorian

    Cirrus Logic (United States), United States

    7 publications · 237 citations

    7

    h-index

  5. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    5 publications · 324 citations

    5

    h-index

1–5 of 394

Institutions

138

  1. University of Piraeus

    Piraeus, Greece

    10 h-index

    25 publications

    1.4K citations

  2. Politecnico di Torino

    Turin, Italy

    9 h-index

    34 publications

    1.1K citations

  3. National and Kapodistrian University of Athens

    Athens, Greece

    9 h-index

    17 publications

    753 citations

  4. AT&T (United States)

    Bedminster, United States

    4 h-index

    5 publications

    539 citations

  5. Princeton University

    Princeton, United States

    4 h-index

    7 publications

    228 citations

  6. Florida International University

    Miami, United States

    4 h-index

    11 publications

    277 citations

  7. IBM (United States)

    Armonk, United States

    4 h-index

    10 publications

    259 citations

  8. Intel (United States)

    Santa Clara, United States

    3 h-index

    7 publications

    94 citations

1–8 of 138

Venues

  1. IEEE Design & Test of Computers

    9 publications · 851 citations

    9

    h-index

  2. IEEE Transactions on Computers

    6 publications · 302 citations

    6

    h-index

  3. International Test Conference

    Conference · 5 publications · 273 citations

    5

    h-index

  4. 3

    h-index

  5. Journal of Education and Learning (EduLearn)

    2 publications · 65 citations

    2

    h-index

1–5